Characterization of LaNi<SUB>5</SUB>, Thin Films Prepared by Sputtering and Evaporating Methods
-
- SAKAGUCHI Hiroki
- Applied Chemistry, Faculty of Engineering, Osaka University
-
- TANIGUCHI Noboru
- Applied Chemistry, Faculty of Engineering, Osaka University
-
- SERI Hajime
- Applied Chemistry, Faculty of Engineering, Osaka University
-
- ADACHI Gin-ya
- Applied Chemistry, Faculty of Engineering, Osaka University
-
- SHIOKAWA Jiro
- Applied Chemistry, Faculty of Engineering, Osaka University
Bibliographic Information
- Other Title
-
- スパッター法および蒸着法により作製されたLaNi<SUB>5</SUB>薄膜の性質
- スパッター法および蒸着法により作製されたLaNi5薄膜の性質
- スパッタ -ホウ オヨビ ジョウチャクホウ ニ ヨリ サクセイサレタ LaNi
- Thin films-preparation, structure and properties. Characterization of LaNi5 thin films prepared by sputtering and evaporating methods.
Search this article
Abstract
Amorphous LaNi5, films were ptepared by a sputtering method. Hydrogenation characteristics of the films were investigated and the results were compared with those of the evaporated films.<BR>The density of the sputtered LaNi5 film was about 6 g/cm3, which was larger than that of the evaporated film. Thermal conductivities of the films were larger than those of a bulk sample,
Journal
-
- NIPPON KAGAKU KAISHI
-
NIPPON KAGAKU KAISHI 1987 (11), 1875-1879, 1987-11-10
The Chemical Society of Japan
- Tweet
Keywords
Details 詳細情報について
-
- CRID
- 1390282679365371776
-
- NII Article ID
- 130004158569
- 40002844919
-
- NII Book ID
- AN00186595
-
- COI
- 1:CAS:528:DyaL1cXpvVGn
-
- ISSN
- 21850925
- 03694577
- http://id.crossref.org/issn/03694577
-
- NDL BIB ID
- 3155886
-
- Data Source
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- Abstract License Flag
- Disallowed