A Method of Lifetime Analysis Based on Small Censored Date
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- Honda Hirotada
- NTT East Corporation, Technical Assistance and Support Center
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- Kita Hiroyuki
- NTT East Corporation, Technical Assistance and Support Center
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- Naruse Yuichi
- NTT East Corporation, Technical Assistance and Support Center
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- Aoyagi Hiroshi
- NTT East Corporation, Technical Assistance and Support Center
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- Miura Shigehiro
- NTT East Corporation, Technical Assistance and Support Center
Bibliographic Information
- Other Title
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- 右側打ち切りを含む少数データに基づく寿命の推定
- ミギガワ ウチキリ オ フクム ショウスウ データ ニ モトズク ジュミョウ ノ スイテイ
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Abstract
We propose a method of parameter estimation and goodness-of-fit test for lifetime analysis based on small censored data. Motivated by lifetime estimation of telecommunication systems, 2-parameter and 3-parameter Weibull distribution are discussed in this paper. The discussion is limited to the case when the censor time is a fixed value. With the application of EIC and bootstrap method, the proposed method enables both parameter estimation and the goodness-of-fit test for the estimated distributions, when the sample size is small and the censored data are included. The discussion also concerns with the evaluation of variation of the esimated bias derived from the small sample size.
Journal
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- Ouyou toukeigaku
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Ouyou toukeigaku 38 (2), 87-108, 2009
Japanese Society of Applied Statistics
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Details 詳細情報について
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- CRID
- 1390282679417904768
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- NII Article ID
- 10026049026
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- NII Book ID
- AN00330942
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- ISSN
- 18838081
- 02850370
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- NDL BIB ID
- 10414253
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed