Analysis of Fixed Pattern Noise from CCD Timing IC

DOI
  • Tashiro S.
    Picture Component Division, Matsushita Electronics Corp.
  • Ihara I.
    Picture Component Division, Matsushita Electronics Corp.
  • Takeda K.
    Picture Component Division, Matsushita Electronics Corp.
  • Miyashita M.
    Picture Component Division, Matsushita Electronics Corp.
  • Sone Y.
    Picture Component Division, Matsushita Electronics Corp.

Bibliographic Information

Other Title
  • 4-5 CCD駆動ICにおける同期信号分周雑音の定量化

Abstract

Correlation between Fixed Pattern Noise level and current ununiformity of CCD timing IC has been quantified. Current simulatrion method to examine current ununiformity has been established.

Journal

Details 詳細情報について

  • CRID
    1390282679425899136
  • NII Article ID
    110004774322
  • DOI
    10.11485/tvac.31.0_67
  • ISSN
    24330930
    09191879
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

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