Analysis of Fixed Pattern Noise from CCD Timing IC
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- Tashiro S.
- Picture Component Division, Matsushita Electronics Corp.
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- Ihara I.
- Picture Component Division, Matsushita Electronics Corp.
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- Takeda K.
- Picture Component Division, Matsushita Electronics Corp.
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- Miyashita M.
- Picture Component Division, Matsushita Electronics Corp.
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- Sone Y.
- Picture Component Division, Matsushita Electronics Corp.
Bibliographic Information
- Other Title
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- 4-5 CCD駆動ICにおける同期信号分周雑音の定量化
Description
Correlation between Fixed Pattern Noise level and current ununiformity of CCD timing IC has been quantified. Current simulatrion method to examine current ununiformity has been established.
Journal
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- Proceedings of The ITE Annual Convention
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Proceedings of The ITE Annual Convention 31 (0), 67-68, 1995
The Institute of Image Information and Television Engineers
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Details 詳細情報について
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- CRID
- 1390282679425899136
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- NII Article ID
- 110004774322
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- ISSN
- 24330930
- 09191879
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles
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- Abstract License Flag
- Disallowed