書誌事項
- タイトル別名
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- Cyclic Stress Measurement in a Microscopic Region Using EBSD Analysis of Grown Grains Occurred in the Copper Foil
抄録
A cyclic biaxial stress measurement method using electrodeposited copper foil was examined. The crystallographic orientations of individual grains that undergo grain growth in copper foil subjected to cyclic loading were analyzed by electron backscatter diffraction (EBSD). An individual grain had the preferred orientation that depended on the biaxial stress condition. The grain slip direction with a high Schmid factor corresponded closely to the direction of first principal shearing stress (maximum shearing stress). When the biaxial stress ratio approaches zero, the difference between the first principal shearing stress and the second principal shearing stress gradually becomes small. Therefore, grain orientation under such a condition was influenced by both principal shearing stresses. On the basis of these features, biaxial stress measurement using a pole figure and an orientation imaging map were proposed in this paper. There is a specific restriction in this method. However, the method has excellent resolution compared with other stress-strain measurement methods since it can measure the principal stresses in an area of 500 μm × 500 μm.
収録刊行物
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- 日本機械学会論文集A編
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日本機械学会論文集A編 77 (775), 391-401, 2011
一般社団法人 日本機械学会
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詳細情報 詳細情報について
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- CRID
- 1390282679455016064
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- NII論文ID
- 130000874172
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- COI
- 1:CAS:528:DC%2BC3MXht1WltrnM
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- ISSN
- 18848338
- 03875008
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- データソース種別
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- JaLC
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- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可