Ultrafast two-dimensional x-ray imaging technique applying two-dimensional image sampling with x-ray streak camera

DOI 1 Citations 9 References
  • Heya M.
    Institute of Laser Engineering, Osaka University
  • Shiraga H.
    Institute of Laser Engineering, Osaka University
  • Nakasuji M.
    Institute of Laser Engineering, Osaka University
  • Yamanaka T.
    Institute of Laser Engineering, Osaka University
  • Mima K.
    Institute of Laser Engineering, Osaka University

Bibliographic Information

Other Title
  • 二次元画像サンプリングを応用したX線ストリークカメラによる超高速二次元X線画像診断技術

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Abstract

In order to meet spatial and temporal resolutions of 2 ps and 5 μm, respectively, we have proposed and designed an ultrafast two-dimensional (2D) x-ray imaging technique applying 2D image sampling with an x-ray streak camera. We have demonstrated proprieties of this diagnostics, 2D sampling image x-ray streak camera (2D-SIXS), experimentally using an x-ray pinhole camera as a single-imaging device. This diagnostics will be available for observing more faster and smaller objects (for example, the core plasmas of a hot spark in inertial confinement fusion and the plasmas generated by ultra-short pulse laser) by utilizing an x-ray microscope with a high magnification of 120 as the x-ray imaging device.

Journal

  • ITE Technical Report

    ITE Technical Report 21.34 (0), 43-48, 1997

    The Institute of Image Information and Television Engineers

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Keywords

Details 詳細情報について

  • CRID
    1390282679499929600
  • NII Article ID
    110003690645
  • NII Book ID
    AN1059086X
  • DOI
    10.11485/itetr.21.34.0_43
  • ISSN
    24241970
    13426893
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

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