Analyses and Measurements of Propagation of Substrate Noise of CMOS Digital Circuit

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  • CMOSデジタル回路における基板雑音の伝搬特性解析と実測評価
  • CMOS デジタル カイロ ニ オケル キバン ザツオン ノ デンパン トクセイ カイセキ ト ジッソク ヒョウカ

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Abstract

Analyses of the substrate noise propagation in the silicon substrate, which are injected during switching operations of logic circuits, are necessary for high performance mixed analog-digital LSI circuits. An equivalent circuit of the CMOS logic noise source, and an F-matrix equivalent circuit model of the substrate with metallic ground wiring systems, are used for simulating the noise generation and propagation in a substrate noise evaluation test chip. Simulated and measured results are very consistent in waveform shapes, in attenuation effects by the propagation, and also in the peak noise amplitudes approximately within 15%.

Journal

  • ITE Technical Report

    ITE Technical Report 24.52 (0), 9-14, 2000

    The Institute of Image Information and Television Engineers

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