Delay Variation Tolerant Subthreshold Digital Circuits for Ultra-Low Power
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- OSAKI Yuji
- Graduate School of Engineering, Kobe University
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- HIROSE Tetsuya
- Graduate School of Engineering, Kobe University
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- MATSUMOTO Kei
- Graduate School of Engineering, Kobe University
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- KUROKI Nobutaka
- Graduate School of Engineering, Kobe University
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- NUMA Masahiro
- Graduate School of Engineering, Kobe University
Bibliographic Information
- Other Title
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- 極低電力サブスレッショルド・ディジタル回路のオンチップ遅延バラツキ補正技術(アナログ,アナデジ混載,RF及びセンサインタフェース回路)
- 極低電力サブスレッショルド・ディジタル回路のオンチップ遅延バラツキ補正技術
- キョクテイ デンリョク サブスレッショルド ディジタル カイロ ノ オンチップ チエン バラツキ ホセイ ギジュツ
Search this article
Abstract
Subthreshold LSIs can achieve ultra-low power. However, threshold voltage variations with temperature and fabrication process have significant impact on the circuit performance. In subthreshold digital circuits, delay time changes exponentially with threshold-voltage variations. To solve this problem, we propose a delay-compensation technique for subthreshold digital circuits. On-chip threshold-voltage monitoring and supply-voltage scaling are adopted to mitigate threshold-voltage variations. As examples of subthreshold digital circuits, we have evaluated the delay time in a ring oscillator and an 8-bit ripple carry adder. With the proposed techinque, the delay time can be improved from log-normal to normal distribution.
Journal
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- ITE Technical Report
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ITE Technical Report 33.39 (0), 165-170, 2009
The Institute of Image Information and Television Engineers
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Details 詳細情報について
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- CRID
- 1390282679504711680
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- NII Article ID
- 110007484210
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- NII Book ID
- AN1059086X
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- ISSN
- 24241970
- 13426893
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- NDL BIB ID
- 10446152
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
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- Abstract License Flag
- Disallowed