An 80μV_<rms> Temporal Noise 82dB Dynamic Range CMOS Image Sensor with a 13 to 19b Variable Resolution Column-Parallel Folding Integration/Cyclic ADC
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- SEO Min-Woong
- Shizuoka University
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- SUH Sungho
- Shizuoka University
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- IIDA Tetsuya
- Brookman Technology
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- WATANABE Hiroshi
- Sanei Hytechs
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- TAKASAWA Taishi
- Shizuoka University
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- AKAHORI Tomoyuki
- Brookman Technology
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- ISOBE Keigo
- Brookman Technology
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- WATANABE Takashi
- Brookman Technology
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- ITOH Shinya
- Shizuoka University
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- KAWAHITO Shoji
- Shizuoka University:Brookman Technology
Bibliographic Information
- Other Title
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- An 80 m Vrms temporal noise 82dB dynamic range CMOS image sensor with a 13 to 19b variable resolution column parallel folding integration cyclic ADC
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Abstract
A 1Mpixel CMOS image sensor with column-parallel folding-integration and cyclic ADCs has 80μV_<rms> (1.2e^-) temporal noise, 82dB dynamic range using 64 samplings in the folding-integration ADC mode. Very high variable gray-scale resolution of 13b through 19b is attained by changing the number of samplings of pixel outputs.
Journal
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- ITE Technical Report
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ITE Technical Report 35.17 (0), 1-4, 2011
The Institute of Image Information and Television Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1390282679505088640
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- NII Article ID
- 110008594071
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- NII Book ID
- AN1059086X
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- ISSN
- 24241970
- 13426893
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- NDL BIB ID
- 11028584
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- CiNii Articles
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- Abstract License Flag
- Disallowed
