3D SEM Measurement of Micro-Optical-Element Shape by Nanoparticle Scattering
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- CHONAN Takayuki
- Graduate School of Engineering, Tohoku University
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- KATAGIRI Baku
- Graduate School of Engineering, Tohoku University
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- KAWAKAMI Tohru
- Graduate School of Engineering, Tohoku University
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- UCHIDA Tatsuo
- Graduate School of Engineering, Tohoku University:Sendi National College of Technology
Bibliographic Information
- Other Title
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- ナノ粒子散布による微細光学素子形状のSEM測定(発光型/非発光型ディスプレイ合同研究会)
- ナノ粒子散布による微細光学素子形状のSEM測定
- ナノ リュウシ サンプ ニ ヨル ビサイ コウガク ソシ ケイジョウ ノ SEM ソクテイ
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Abstract
Optical elements for display are required more complex control of the incident light, therefore measurements and evaluations of three-dimensional surface shape become more important. However conventional measurement methods of the surface shape can't measure samples with very flat surface or steep slope accurately. In this study, we try to measure three-dimensional shape with SEM more accurately by making fine pattern with scattering nanoparticles. As a result, we show the relation between the magnification of the nanoparticles and the accuracy of the measurement, and confirm the validity of the measurement.
Journal
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- ITE Technical Report
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ITE Technical Report 35.4 (0), 49-52, 2011
The Institute of Image Information and Television Engineers
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Details 詳細情報について
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- CRID
- 1390282679505469696
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- NII Article ID
- 10027800171
- 110008593005
- 40018272618
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- NII Book ID
- AN1059086X
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- ISSN
- 09135685
- 24241970
- 13426893
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
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- Abstract License Flag
- Disallowed