Open Lead Detection Method by Sensing the Switching Current of CMOS Gate on Sensing Probe

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  • Ono Akira
    Department of Telecommunications, Takuma National College of Technology
  • Ichimiya Masahiro
    Institute of Technology and Science, The University of Tokushima
  • Yotsuyanagi Hiroyuki
    Institute of Technology and Science, The University of Tokushima
  • Takagi Masao
    Department of Electronic Engineering, Takuma National College of Technology
  • Hashizume Masaki
    Institute of Technology and Science, The University of Tokushima

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  • ＣＭＯＳゲート回路を断線センサとして用いた部品接合不良検出法
  • CMOS ゲート カイロ オ ダンセン センサ ト シテ モチイタ ブヒン セツゴウ フリョウ ケンシュツホウ

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Abstract

We propose a new test method for detecting open leads on ICs. The test method is based on using the supply current of a CMOS gate as an open lead detector; the current flows when an AC voltage signal is provided to a targeted lead with a probe as a stimulus. To evaluate the test method, we examined whether it could detect open leads in SSIs and LSIs. The experimental results confirm that open leads can be detected within 1 μsec by providing an AC voltage signal with an amplitude that is 60% of the power supply voltage of the targeted IC.

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