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Visualization System of Electromagnetic Wave Arrival Direction with Lüneburg Lens and EBG Absorber
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- Ohmae Aya
- Yokohama Research Laboratory, Hitachi Ltd.
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- Hoda Isao
- Yokohama Research Laboratory, Hitachi Ltd.
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- Paoletti Umberto
- Yokohama Research Laboratory, Hitachi Ltd.
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- Li Wen
- Yokohama Research Laboratory, Hitachi Ltd.
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- Suga Takashi
- Yokohama Research Laboratory, Hitachi Ltd.
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- Osaka Hideki
- Yokohama Research Laboratory, Hitachi Ltd.
Bibliographic Information
- Other Title
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- ルネベルグレンズとEBG型電界センサを用いた電磁波到来方向可視化システム
- ルネベルグレンズ ト EBGガタ デンカイ センサ オ モチイタ デンジハ トウライ ホウコウ カシカ システム
- Visualization System of Electromagnetic Wave Arrival Direction with Lüneburg Lens and EBG Absorber
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Description
A novel high-resolution electromagnetic-wave-source visualization system is presented. The system can determine the incidence angle and visualize the wave source by combining a Lüneburg lens with an electromagnetic band gap (EBG) absorber. The Lüneburg lens is used to physically separate the incident waves coming from different directions and to focus them onto the different focal points on the lens surface. Every element of the EBG absorber coincides with a different focal point on the lens surface, so that the intensity and angle information of the incident wave can be obtained based on the absorbed power and position of the corresponding sensor element. The estimated angular resolution is 2.56 degrees and the system sensitivity is −65.6 dBm/m2 at 2.45 GHz. The results were confirmed by prototype evaluation.
Journal
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- Journal of The Japan Institute of Electronics Packaging
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Journal of The Japan Institute of Electronics Packaging 18 (1), 73-81, 2015
The Japan Institute of Electronics Packaging
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Keywords
Details 詳細情報について
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- CRID
- 1390282679537886464
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- NII Article ID
- 130005062095
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- NII Book ID
- AA11231565
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- ISSN
- 1884121X
- 13439677
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- NDL BIB ID
- 026024462
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed