Optimization of Heat Cycle Test Time of Pb-Free Solder by Thermal Fatigue Simulation
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- YOKOTA Yasuo
- AVC Development Center, PAVC Company, Matsushita Electric Industial Co., Ltd.
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- WATANABE Masaki
- Visual Products and Display Devices Business Group, PAVC Company, Matsushita Electric Industrial Co., Ltd.
Bibliographic Information
- Other Title
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- 熱疲労シミュレーションによる鉛フリーはんだヒートサイクル試験期間の適正化
- ネツ ヒロウ シミュレーション ニ ヨル ナマリ フリー ハンダ ヒートサイクル シケン キカン ノ テキセイカ
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Abstract
Recently, several Pb free solder are introduced on the electric appliance rapidly. But, for the co-existing of enough quality and short development L/T on the electric appliance, it become doubtful whether the existing reliability standard of heat cycle test based on the Sn-Pb solder can be used or not. Therefore, in this paper, in order to reconsider the existing standard, thermal fatigue simulation of Pb free solder with Anand model was carried out and the necessary and minimum heat cycle time for Pb free solder was calculated. In addition to that, the acceleration factors for several solders are compared. As a result of that, it became clear that the necessary and minimum heat cycle time for Pb free solder could be shortened than that of Sn-Pb solder and that the existing reliability standard based on Sn-Pb should be changed.
Journal
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- Journal of The Japan Institute of Electronics Packaging
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Journal of The Japan Institute of Electronics Packaging 7 (1), 76-81, 2004
The Japan Institute of Electronics Packaging
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Details 詳細情報について
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- CRID
- 1390282679538512000
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- NII Article ID
- 130004166075
- 110001235330
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- NII Book ID
- AA11231565
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- ISSN
- 1884121X
- 13439677
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- NDL BIB ID
- 6814194
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed