A Method for Determining MIS Interface States by Therma- lly Stimulated Surface Potential

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  • Yamashita Ken
    Department of Electrical and Electronic Engineering, Faculty of Engineering, Tokyo Institute of Technology
  • Iwamoto Mitsumasa
    Department of Electrical and Electronic Engineering, Faculty of Engineering, Tokyo Institute of Technology
  • Hino Taro
    Department of Electrical and Electronic Engineering, Faculty of Engineering, Tokyo Institute of Technology

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  • 熱刺激表面電位によるＭＩＳ界面準位の測定法
  • ネツ シゲキ ヒョウメン デンイ ニヨル MIS カイメン ジュンイ ノ ソク

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記事分類: 電気工学--電子工学--電子部品--固体素子

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