書誌事項
- タイトル別名
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- Trace Elemental Analysis Technologies using Atmospheric Plasma Sources
- タイキアツ プラズマ オ モチイタ ビリョウ ゲンソ ブンセキ ギジュツ
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説明
Trace elemental analysis technologies using atmospheric plasma sources have been used in many fields such as environmental analysis, semiconductor industry and medicine. Since 1970's, argon inductively coupled thermal plasma (ICP) has been used as ionization or excitation source for atomic emission spectrometry or mass spectrometry because of the excellent power of detection and the ability to measure isotope ratios. However, it is difficult to determine high ionization potential elements such as halogens and rare gases by using argon plasma. In order to overcome argon ICP, many types of atmospheric plasma sources have been developed and investigated. Furthermore, some kinds of sample introduction systems have been developed and applied with the plasma sources. As a result, sub-pg/mL of detection limits for almost all elements are realized.
収録刊行物
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- 電気学会論文誌. A
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電気学会論文誌. A 130 (10), 955-962, 2010
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1390282679575421952
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- NII論文ID
- 10026693553
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- NII書誌ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL書誌ID
- 10831134
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可