Evaluation of DC Biased RF / Pulsed Atmospheric Microplasma Source for Trace Elemental Analysis
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- Nagata Yoichi
- Department of Energy Sciences, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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- Miyahara Hidekazu
- Department of Energy Sciences, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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- Ohba Goro
- Department of Energy Sciences, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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- Isobe Takanori
- Integrated Research Institute, Tokyo Institute of Technology
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- Shimada Ryuichi
- Integrated Research Institute, Tokyo Institute of Technology
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- Hotta Eiki
- Department of Energy Sciences, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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- Okino Akitoshi
- Department of Energy Sciences, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
Bibliographic Information
- Other Title
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- 微量元素分析用高周波/パルス重畳大気圧マイクロプラズマ源の評価
- ビリョウ ゲンソ ブンセキヨウ コウシュウハ パルス チョウジョウ タイキアツ マイクロプラズマ ゲン ノ ヒョウカ
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Abstract
Inductively coupled plasma (ICP) is widely used as an ionization or excitation source for elemental analysis. It is one of the most powerful tools because of its excellent sensitivity. Recent years, target of elemental analysis has been shifted to smaller samples such as nano-particles, biocells, etc. But conventional ICP is not suitable for these targets because it consumes large amount sample solution. To analyze small amount samples efficiently, we have developed and studied a microplasma source for elemental analysis. In this study, dc power supply was used to generate microplasma at first, but the analytical figure of merit was not enough high. The probable reason was plasma temperature and electron number density were lower than that of Ar-ICP. To improve the analytical performances, several types of power supplies are tested. It includes dc biased RF and dc biased pulse power supply. In order to evaluate the analytical performance of merit, the emission intensity from some typical elements and the fundamental plasma properties are measured. The excitation temperature of RF driven microplasma increases by 400 K at 30 W of RF input power. And the lower limit of halogens detection improves about 35% with pulse operation compared to dc.
Journal
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- IEEJ Transactions on Fundamentals and Materials
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IEEJ Transactions on Fundamentals and Materials 130 (7), 669-676, 2010
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390282679576119168
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- NII Article ID
- 10026865243
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- NII Book ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL BIB ID
- 10740762
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed