Action Confirmation Test of the Semiconductor Current Limiter using DSP and IGBT

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  • DSPとIGBTを用いた半導体型限流器の動作確認試験
  • DSP ト IGBT オ モチイタ ハンドウタイガタゲンリュウキ ノ ドウサ カクニン シケン

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Abstract

This paper carries out the action confirmation test of a semiconducting-type fault current limiter (FCL) using the digital signal processor (DSP) to improve the instantaneous voltage drop and to reduce the fault current of power system. A insulated gate bipolar transistor (IGBT) is used as a commutation element of the FCL. The IGBT is a kind of the MOS-type gate power device. By using the IGBT, the high-speed operation of large current and high voltage can be realized. Next, the DSP is used in the FCL in order to detect the fault current at high speed. The DSP used in a test equipment is a starter kit (Texas Instrument TMS320C67). This is mainly used by the real-time processing, and it is suitable for the high-speed operation. <br>The examination was carried out using computer simulation and a test equipment of small capacity in order to demonstrate the effectiveness of the technique using in this paper. Three kinds of FCLs are used in this paper. One is a resisted type and another is a reactor type. One of the remainder is the Z type which parallelly connected resistance and reactor. From computer simulation using PSCAD/EMTDC and small-scale experiment, three kinds of fault current limiter used in this paper confirmed moving within 1 msec from the fault detection to the action completion.

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