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SOBINMF for Automatic Removal of Ocular Artifacts from the EEG
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- Tsubakida Hirohisa
- Graduate School of Advanced Science and Engineering, Waseda University
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- Ono Yumie
- School of Science and Technology, Meiji University
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- Ishiyama Atsushi
- Graduate School of Advanced Science and Engineering, Waseda University
Bibliographic Information
- Other Title
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- SOBINMFによる眼電自動除去システム
- SOBINMF ニ ヨル ガンデンジドウ ジョキョ システム
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Description
This paper introduces a novel method to automatically remove electro-oculogram (EOG) from electroencephalogram (EEG) using second-order blind identification (SOBI) and nonnegative matrix factorization (NMF). To demonstrate the effectiveness of the proposed method, we applied SOBI, NMF, or combined SOBI and NMF (SOBINMF) to the EEG data during motor imagery task in which participants imagined moving their left or right hand. Ocular artifacts were removed more effectively in our proposed SOBINMF method compared to SOBI or NMF alone.
Journal
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- IEEJ Transactions on Electronics, Information and Systems
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IEEJ Transactions on Electronics, Information and Systems 135 (8), 954-962, 2015
The Institute of Electrical Engineers of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390282679584382208
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- NII Article ID
- 130005090617
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- NII Book ID
- AN10065950
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- ISSN
- 13488155
- 03854221
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- NDL BIB ID
- 026676931
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed
