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- Nishio Yoji
- Hitachi Research Laboratory, Hitachi, Ltd.
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- Murabayashi Fumio
- Hitachi Research Laboratory, Hitachi, Ltd.
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- Watanabe Atsuo
- Hitachi Research Laboratory, Hitachi, Ltd.
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- Ikeda Takahide
- Device Development Center, Hitachi, Ltd.
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- Kadono Shinji
- Takasaki Works, Hitachi, Ltd.
Bibliographic Information
- Other Title
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- VLSI用BiCMOS論理ゲートの試作と評価
- VLSIヨウ BiCMOS ロンリ ゲート ノ シサク ト ヒョウカ
Search this article
Description
記事分類: 電気工学--電子工学--集積回路
Journal
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- IEEJ Transactions on Electronics, Information and Systems
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IEEJ Transactions on Electronics, Information and Systems 109 (11), 805-811, 1989
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390282679586220672
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- NII Article ID
- 130006845066
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- NII Book ID
- AN10065950
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- ISSN
- 13488155
- 03854221
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- NDL BIB ID
- 3257465
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
