Effect of Electrode Position on Detection of Delamination of CFRP by Electrical Potential Method.
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- TODOROKI Akira
- Dept. of Mechano-aerospace Eng., Tokyo Institute of Technology
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- SUZUKI Hiroshi
- Graduate Student, Tokyo Institute of Technology
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- SHIMAMURA Yoshinobu
- Dept. of Mechano-aerospace Eng., Tokyo Institute of Technology
Bibliographic Information
- Other Title
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- 電気ポテンシャル法を用いたCFRP層間はく離検出に及ぼす電極位置の影響
- デンキ ポテンシャルホウ オ モチイタ CFRP ソウカン ハクリ ケンシュツ
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Abstract
Smart structures are appropriate approaches to obtain high reliability for structures made of CFRP. Electrical potential method for detection of damages does not bring strength reduction of CFRP structures. Authors have studied the effects of orthotropic electrical resistance on detection of delamination cracks, and have proposed a new approach for measurement of the electric resistance in the thickness direction by using FEM. In the present study, numerical analysis conducted in detail to investigate the effect of electrode positions on detection of delamination cracks by using the electric potential method. FEM analysis shows that construction of electrodes on 0°-ply surface is the best way to detect the delamination cracks from voltage changes between electrodes. Multiple cases of delamination size and position are calculated, and compared with each other. As a result, it is shown that the delamination cracks can be detected by using electric potential method, but the identification of the size and position of the delamination cracks is very difficult even if electric voltage changes are measured among 3 points. For the identification of the size and position, more information would be required.
Journal
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- Journal of the Japan Society for Composite Materials
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Journal of the Japan Society for Composite Materials 24 (5), 176-182, 1998
The Japan Society for Composite Materials
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Details 詳細情報について
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- CRID
- 1390282679600196480
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- NII Article ID
- 10002465640
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- NII Book ID
- AN00196748
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- ISSN
- 18848559
- 03852563
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- NDL BIB ID
- 4571781
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed