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- UEDA Toshitsugu
- Corporate Technology Development Division, Yokogawa Electric Corp.
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- OKAMOTO Yasunori
- Advanced Technology Laboratory, Kubota Corp.
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- NAGAI Satoshi
- National Research Laboratory of Metrology
Bibliographic Information
- Other Title
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- 半導体製造工程におけるin situ計測技術
Abstract
In situ measurements in semiconductor manufacturing with lasers are advantageous in that they cause very little disturbance to objects and allow real-time accurate quantification. This paper reviews three in situ measuring methods for gas concentration, particle identification, and wafer temperature based on IR absorption, laser induced breakdown (LIB) and laser ultrasound generation in solids, respectively.
Journal
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- The Review of Laser Engineering
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The Review of Laser Engineering 27 (10), 676-681, 1999
The Laser Society of Japan
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Details 詳細情報について
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- CRID
- 1390282679622690048
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- NII Article ID
- 130003702604
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- ISSN
- 13496603
- 03870200
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- Text Lang
- ja
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed