Measurement of position and posture using image processing by projective pattern on an object.

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  • 回折パターン投影による物体の位置と姿勢の測定法
  • カイセツ パターン トウエイ ニ ヨル ブッタイ ノ イチ ト シセイ ノ ソ

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Abstract

For the optical measurement of the object shape, several methods such as moire method or one point measuring method are generally employed. However, the former takes considerable time to process, and the latter gives only the position of one point. For the object with simple form, there are cases that its position and posture are simultaneously necessary. This paper proposes a measuring method using digital image processing, that is applied for above cases and is available to measure both position and posture in a short time. In this method, an X-pattern is projected to an object and the deformed X-pattern is observed from another direction. The position and posture are obtained by analyzing the deformed pattern. As an experimental result, the position measuring accuracy of 0.2 mm is achieved, when the object's moving range is 100 mm and the distance between the origin and the camera is about 1 m. The angle measuring accuracy is 0.2 degree, when the object's rotation range is 50 degree. The time required for one point measuring is about 1 second. The method is applicable to measure the position, the angle, the shape of floor and so on.

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