Thin-Film Head with Domain Structure Stabilized by the Magnetoelastic Effect
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- Shinoura O.
- R & D Center, TDK Corporation
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- Koyanagi T.
- Data Storage Components Group, TDK Corporation
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- Nakagawa Y.
- Data Storage Components Group, TDK Corporation
Bibliographic Information
- Other Title
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- 磁気弾性効果により磁極磁区構造を安定化した薄膜ヘッド
- ジキ ダンセイ コウカ ニ ヨリ ジキョク ジク コウゾウ オ アンテイカシタ
- 磁気弾性効果により磁極磁区構造を安定化した薄膜ヘッド (<特集>磁気ヘッド・磁気記録再生特性)
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Abstract
A new technique for creating a thin-film head with a controlled domain structure was investigated. The difference between the thermal expansion coefficients of the magnetic film and the photoresist insulation layer greatly affects the stress distribution across the upper magnetic core after annealing. Tensile stress is induced in the lower part of the upper magnetic core, and compressive stress is induced in the upper part of the core. The composition distribution of NiFe alloy across the upper core can be controlled by means of the electroplating conditions. Consequently, magnetoelastic effect anisotropy can be induced to stabilize the domain structure of the upper magnetic core. This new technique was used to fabricate a thin-film head with low wiggle noise.
Journal
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- Journal of the Magnetics Society of Japan
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Journal of the Magnetics Society of Japan 21 (4_2), 245-248, 1997
The Magnetics Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390282680069548800
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- NII Article ID
- 110002809856
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- NII Book ID
- AN0031390X
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- ISSN
- 18804004
- 02850192
- http://id.crossref.org/issn/02850192
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- NDL BIB ID
- 4192908
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- Data Source
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- JaLC
- NDL
- Crossref
- NDL-Digital
- CiNii Articles
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- Abstract License Flag
- Disallowed