A Polycrystalline Oxide TFT Driven Active Matrix-OLED Display
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- Terai Yasuhiro
- Core Device Development Group, Sony Corporation
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- Arai Toshiaki
- Core Device Development Group, Sony Corporation
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- Morosawa Narihiro
- Core Device Development Group, Sony Corporation
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- Tokunaga Kazuhiko
- Core Device Development Group, Sony Corporation
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- Fukumoto Eri
- Core Device Development Group, Sony Corporation
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- Kinoshita Tomoatsu
- Core Device Development Group, Sony Corporation
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- Fujimori Takashige
- Core Device Development Group, Sony Corporation
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- Sasaoka Tatsuya
- Core Device Development Group, Sony Corporation
Bibliographic Information
- Other Title
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- 多結晶酸化物半導体TFTを用いたアクティブマトリクス有機ELディスプレイの開発
Description
We developed a high mobility polycrystalline oxide semiconductor, IGO (Indium Gallium Oxide), which is the crystalline In2O3 based random orientation polycrystalline material. The polycrystalline IGO has two unique characteristics. One is the high mobility with a wide window for fabrication process and the property is much stable. The other is the wet etching tolerance which enables the merged photolithography process. In spite of the low temperature process below 300°C, the mobility of polycrystalline IGO TFT was over 20cm2/Vs with the standard deviation smaller than 1cm2/Vs and the shift of the threshold voltage after positive bias temperature stress (Vg=Vd=15V, 10, 000s) was smaller than 0.3V. These results imply that the interruption of carrier conductivity at the grain boundaries of polycrystalline structure can be neglected with respect to the TFT characteristics and the reliability. From these properties, we concluded that the polycrystalline IGO is one of the promising channel materials for the backplane TFT of future OLED displays.
Journal
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- The Journal of The Institute of Image Information and Television Engineers
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The Journal of The Institute of Image Information and Television Engineers 66 (10), J339-J345, 2012
The Institute of Image Information and Television Engineers
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Details 詳細情報について
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- CRID
- 1390282680103362176
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- NII Article ID
- 130002111108
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- ISSN
- 18816908
- 13426907
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- Text Lang
- ja
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed