書誌事項
- タイトル別名
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- AN APPROACH TO THE APPLICATION OF THE METHOD TO IMPROVE WAFER QUALITY BY USING BOTTOM ROUGHNESS
説明
Nowadays water pollution caused by eutrophication in a semi-enclosed bay has been a serious problem. In order to solve this problem, a method has been proposed to activate the water exchange between an inner bay and its outer sea area by using Bottom Roughness with directional resistance properties. In this paper, a possibility for practical use of this method was examined from many angles. First, the basic effect of Bottom Roughness on substance transport was examined by a laboratory experiment Next, 2-dimensional numerical simulations were carried out to estimate the validity of this method in the Nagoya Port that has a complicated topography. Lastly, it was it-ported that four kinds of Bottom Roughness were sunk to investigate their influence on the scour of seabed and the water environment. From these results, it becomes clear that this method is efficient to improve the water quality in real sea areas.
収録刊行物
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- 水工学論文集
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水工学論文集 44 957-962, 2000
公益社団法人 土木学会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390282680146368000
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- NII論文ID
- 130004043242
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- ISSN
- 18849172
- 09167374
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- データソース種別
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- JaLC
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- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可