Convenient Method of X-Ray Absorption Spectroscopy Using EPMA

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Other Title
  • EPMAによるX線吸収スペクトル簡易測定法
  • EPMA ニ ヨル Xセン キュウシュウ スペクトル カンイ ソクテイホウ

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Description

Fine structures in X-ray fluorescence spectra are explained from the view point of trace analysis. Among these fine structures, the physical processes of the X-ray Raman and radiative Auger effects are explained in detail. The similarity between the radiative Auger effect and X-ray absorption fine structures (XAFS) are described. A novel method to measure the XAFS spectra using the radiative Auger effect is explained; this method has been named EXEFS. Various numerical results of EXEFS Fourier analysis are described with the change of parameters in the numerical analysis. A potential of applying EXEFS method to microbeam analysis is reviewed.

Journal

  • Tetsu-to-Hagane

    Tetsu-to-Hagane 85 (5), 353-361, 1999

    The Iron and Steel Institute of Japan

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