Analysis of Tip Stability in Adhesion Process in AFM Using Potential Energy Surface: Stability Versus Dissipation
-
- Senda Yasuhiro
- Department of Applied Science, Yamaguchi University
-
- Blomqvist Janne
- COMP Centre of Excellence, Department of Applied Physics, Aalto University
-
- Nieminen Risto
- COMP Centre of Excellence, Department of Applied Physics, Aalto University
書誌事項
- 公開日
- 2018-05-03
- 資源種別
- journal article
- DOI
-
- 10.1380/ejssnt.2018.132
- 公開者
- 公益社団法人 日本表面真空学会
説明
<p>We analyze the stability of the atomic configurations of tips in the adhesion process in noncontact atomic force microscopy (AFM) using a potential energy surface (PES). We calculate the PES for two types of atomic configurations of the tip as typical cases of reconstruction and irreversible change during the adhesion process. The stability of the tips after atomic contact with the surface is explained on the basis of the calculated PESs, which are affected by the strength of the atomic bond between the tip and the surface. It is shown from the computational model for the AFM that an unstable tip leads to a larger energy dissipation compared to that for a stable tip. [DOI: 10.1380/ejssnt.2018.132]</p>
収録刊行物
-
- e-Journal of Surface Science and Nanotechnology
-
e-Journal of Surface Science and Nanotechnology 16 (0), 132-136, 2018-05-03
公益社団法人 日本表面真空学会
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1390282680164022656
-
- NII論文ID
- 130006733387
-
- ISSN
- 13480391
-
- 本文言語コード
- en
-
- 資料種別
- journal article
-
- データソース種別
-
- JaLC
- Crossref
- CiNii Articles
- KAKEN
- OpenAIRE
-
- 抄録ライセンスフラグ
- 使用不可
