A low-variation on-resistance CMOS sampling switch for high-speed high-performance applications

書誌事項

公開日
2012
DOI
  • 10.1587/elex.9.339
公開者
一般社団法人 電子情報通信学会

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説明

This paper presents a high-linear bootstrapped sampling switch for high-speed applications. The proposed switch utilizes bootstrapping technique of both NMOS and PMOS types simultaneously. Thus, results in a low-variation low-value on-resistance switch. Using this idea, the proposed switch considers reliability constrains, and operates in full-swing input range. Furthermore, it is suitable for standard n-well CMOS technology. Simulation results show that proposed switch achieves on-resistance variation of less than 4% through full-range input signal.

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