Examinee Identification in e-Test using Press Localized Arc Pattern Method
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- KIKUCHI Shinichi
- Graduate School of Engineering, Tokyo University of Science
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- FURUTA Takehiro
- Faculty of Engineering, Tokyo University of Science
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- AKAKURA Takako
- Faculty of Engineering, Tokyo University of Science
Bibliographic Information
- Other Title
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- e-Testにおける受験者認証のための筆圧局所円弧パターン法の提案
- e Test ニ オケル ジュケンシャ ニンショウ ノ タメ ノ ヒツアツ キョクショ エンコ パターンホウ ノ テイアン
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Description
In this paper, we study an identification method to confirm examinees periodically during e-tests. First, we apply the localized arc pattern method, conventionally used for off-line identification based on the arc of an individual stroke of a certain sentence on paper, for examinee identification using pen tablets. Second, we propose a pressure localized arc pattern method that utilizes writing pressure which can be obtained on pen tablet, and evaluate the effectiveness of this method. Finally, we conduct e-tests to evaluate the pressure localized arc pattern method. Results of the e-tests suggest that pressure localized arc patterns can be used in examinee identification.
Journal
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- Japan Journal of Educational Technology
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Japan Journal of Educational Technology 33 (4), 383-392, 2010
Japan Society for Educational Technology
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Keywords
Details 詳細情報について
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- CRID
- 1390282680204201600
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- NII Article ID
- 110007539010
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- NII Book ID
- AA11964147
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- ISSN
- 21896453
- 13498290
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- NDL BIB ID
- 10589023
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed