A study of materials Reducing Backscattered Radiations in X-ray for Diagnosis

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  • Inoue Kazumasa
    Tokyo metropolitan university of health sciences, graduate school
  • Hosoda Masahiro
    Tokyo metropolitan university of health sciences, graduate school:Chuoh college of medical technology
  • Fukushi Masahiro
    Tokyo metropolitan university of health sciences, graduate school

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  • 診断用X線における後方散乱線低減物質の検討
  • シンダンヨウ Xセン ニ オケル コウホウ サンランセン テイゲン ブッシツ ノ ケントウ

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Abstract

In experiments using X-ray, backscattering is one of the causes of measurement errors. Especially, in the presence of material in the beam direction that characteristically exhibit high levels of backscatters, their influences grow great. Firstly, the characteristics of backscatter production of various materials with different atomic numbers were analyzed. The relationships between the dose rate of scattered radiation and atomic numbers of the materials at an angle of 45° in the rear side was studied by using the ionization chamber survey meter. Next, mechanism of generation for the backscatter radiation was studied based on the energy spectrum with CZT detector. Result ; Cu (Z=29) exhibited the lowest levels of backscatter. Furthermore, materials with atomic numbers 30 or below were greatly influence by Compton scattering. Materials with atomic numbers of about above 30 and below 50, generate X-ray (K), those above 50 generate characteristic X-ray (L), as back scatter radiation, therefore the mechanism differed as atomic numbers increased. It is important to take into account of the above findings to decrease the influence of the back scattered radiation in appropriate measures.

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