Study on Solid Cooling by Low-pressure Gas of Normal Temperature (1st report)
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- TAKAHASHI Satoshi
- (株) ニコン
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- UDAGAWA Shinsuke
- 千葉大学自然科学研究科
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- MAENO Kazuo
- 千葉大学工学部
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- TOYODA Kazuhiro
- 千葉大学工学部
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- HIRAYANAGI Noriyuki
- (株) ニコン
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- SHIRAHAMA Ichiro
- (株) レヨーン工業
Bibliographic Information
- Other Title
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- 常温低圧ガスによる固体冷却に関する研究 (第1報)
- ジョウオン テイアツ ガス ニ ヨル コタイ レイキャク ニ カンスル ケンキュウ ダイ1ポウ デンネツ トクセイ ヒョウカ ソウチ ノ カイハツ ト ソウチ セイノウ ヒョウカ
- —Development of Evaluation Apparatus on Heat Transfer Characteristics and its Performance Estimation—
- ―伝熱特性評価装置の開発と装置性能評価―
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Description
The evaluation apparatus on heat transfer characteristic for low-pressure gas of normal temperature is developed with the object of improving in the numerical prediction accuracy for thermal deformation of the silicon wafer caused during exposure, and constructing of the novel wafer chuck systems with cooling effect by such gas condition in the Next-Generation Lithography exposure tools. As the first phase, the heat transfer characteristics between low-pressure helium gas and aluminum disc, which is well known as a vacuum equipment material, are evaluated using this apparatus. The heat transfer coefficients of low-pressure helium gas are obtained as by curve fitting for experimental data using finite element analysis. These obtained heat transfer coefficients show good agreement with theoretical data, except high-pressure condition corresponding to the bending of aluminum disc. The cooling effect of low-pressure helium gas on the silicon wafer is confirmed using developed apparatus.
Journal
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- Journal of the Japan Society for Precision Engineering, Contributed Papers
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Journal of the Japan Society for Precision Engineering, Contributed Papers 71 (6), 739-743, 2005
The Japan Society for Precision Engineering
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Details 詳細情報について
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- CRID
- 1390282680257138688
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- NII Article ID
- 10015673697
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- NII Book ID
- AA11966630
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- ISSN
- 18818722
- 13488716
- 13488724
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- NDL BIB ID
- 7388212
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed