A fast two-dimensional measurement system of birefringence dispersion for LCD retardation film
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- WAKAYAMA Toshitaka
- 東京農工大学大学院
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- OTANI Yukitoshi
- 東京農工大学大学院
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- UMEDA Norihiro
- 東京農工大学大学院
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- KUROKAWA Takashi
- 東京農工大学大学院
Bibliographic Information
- Other Title
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- 液晶用位相差フィルムのための2次元高速複屈折分散測定装置の開発
- エキショウヨウ イソウサ フィルム ノ タメ ノ 2ジゲン コウソク フククッセツ ブンサン ソクテイ ソウチ ノ カイハツ
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Description
A fast two-dimensional measurement system of birefringence dispersion is developed for inspection of LCD retardation film. An optical arrangement of this system consists of a polarizer, a carrier retarder and an analyzer. The carrier retarder can be introduced a carrier frequency into an intensity distribution along wave number. A Xenon flash lamp is employed as a white light source and synchronized with the line type of imaging spectrometer. The detected intensity distribution changes the sinusoidal wave along wave number. A phase distribution is calculated by Fourier transform method. The retardation distribution of a polymer sample is analyzed to subtract phase distributions with and without the sample. In the experiments, the some polymer films are measured as demonstrations and evaluated to the non-uniformity of retardation distribution.
Journal
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- Journal of the Japan Society for Precision Engineering, Contributed Papers
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Journal of the Japan Society for Precision Engineering, Contributed Papers 72 (5), 602-606, 2006
The Japan Society for Precision Engineering
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Details 詳細情報について
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- CRID
- 1390282680258386176
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- NII Article ID
- 110004717808
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- NII Book ID
- AA11966630
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- ISSN
- 18818722
- 13488716
- 13488724
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- NDL BIB ID
- 7953203
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed