Element-Specific Evaluation of Magnetic Moments in Ferrimagnetic Mn2VAl Heusler Epitaxial Thin Films

DOI Web Site 31 References
  • Kubota T.
    Department of Applied Physics, Tohoku University
  • Kodama K.
    Japan Synchrotron Radiation Research Institute (JASRI) / SPring-8
  • Nakamura T.
    Japan Synchrotron Radiation Research Institute (JASRI) / SPring-8
  • Sakuraba Y.
    Institute for Materials Research, Tohoku University
  • Oogane M.
    Department of Applied Physics, Tohoku University
  • Naganuma H.
    Department of Applied Physics, Tohoku University
  • Takanashi K.
    Institute for Materials Research, Tohoku University
  • Ando Y.
    Department of Applied Physics, Tohoku University

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Other Title
  • フェリ磁性ホイスラー合金Ｍｎ２ＶＡｌエピタキシャル薄膜の元素選択的磁気特性評価
  • フェリ ジセイ ホイスラー ゴウキン Mn2VAl エピタキシャル ハクマク ノ ゲンソ センタクテキ ジキ トクセイ ヒョウカ

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Abstract

  We successfully fabricated L21-ordered Mn2VAl Heusler thin films and evaluated their ferrimagnetic properties by soft x-ray magnetic circular dichroism (XMCD). The buffer layers and annealing temperatures were varied to prepare the Mn2VAl films. We discovered that Mn2VAl could be ordered in an L21 phase well when it was deposited directly onto an MgO (001) single crystalline substrate. The maximum values of L21 and B2 long-range order parameters we obtained were about 0.5 for both phases for samples without a buffer layer, when substrates were heated at 500°C or 600°C. The saturation magnetization (Ms) for these samples was roughly 150 emu/cc. This is rather small compared to that expected from the ideal Slater-Pauling behavior, which might be due to the suppressed degree of L21 or B2 ordering. Ferrimagnetism in the Mn2VAl, ferrimagnetic coupling between Mn and V moments was clearly observed by using the XMCD technique in well-ordered L21-Mn2VAl film as has been predicted in theoretical investigations.

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