-
- Watanabe N.
- Graduate School of Engineering Science, Osaka Univ.
-
- Matsusawa S.
- Graduate School of Engineering Science, Osaka Univ.
-
- Miyato Y.
- Graduate School of Engineering Science, Osaka Univ.
-
- Itozaki H.
- Graduate School of Engineering Science, Osaka Univ.
この論文をさがす
抄録
We measured the high-resolution magnetic images using an STM-SQUID microscope that combines a high-Tc superconducting quantum interference device (SQUID) with a scanning tunneling microscope (STM). In the STM-SQUID microscope, the STM probe plays the important role of a flux guide and is responsible for tunneling current detection. Therefore, it is essential to investigate the probe itself in order to improve the magnetic image resolution. We optimized the electrochemical polishing condition to realize the fine probe with a tip radius of 50 nm or less. We fabricated the various shaped probes by controlling the voltage during sharpening. The tip radius of 50 nm or less was achieved when the probe tip was sharpened at the applied voltage of 30 V. We then measured the magnetic images of typical magnetic materials, such as a steel sample and nickel thin films, using the probe with a tip radius of 50 nm or less. The magnetic domain structures were observed clearly.
収録刊行物
-
- Journal of the Magnetics Society of Japan
-
Journal of the Magnetics Society of Japan 37 (3-2), 235-238, 2013
公益社団法人 日本磁気学会
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1390282680262743168
-
- NII論文ID
- 40019724985
- 130004502839
-
- NII書誌ID
- AA12297999
-
- COI
- 1:CAS:528:DC%2BC3sXptVWgurs%3D
-
- ISSN
- 18822932
- 18822924
-
- NDL書誌ID
- 024730970
-
- 本文言語コード
- en
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
-
- 抄録ライセンスフラグ
- 使用不可
