Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser
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- TANAKA Yoshihito
- RIKEN/SPring-8 Center Department of Physics, School of Science and Technology, Kwansei Gakuin University
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- ITO Kiminori
- RIKEN/SPring-8 Center
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- NAKATANI Takashi
- RIKEN/SPring-8 Center Department of Physics, School of Science and Technology, Kwansei Gakuin University
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- ONITSUKA Rena
- RIKEN/SPring-8 Center Department of Physics, School of Science and Technology, Kwansei Gakuin University
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- NEWTON Marcus
- Research Institute for Electronic Science, Hokkaido University
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- SATO Takahiro
- RIKEN/SPring-8 Center
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- TOGASHI Tadashi
- Japan Synchrotron Radiation Research Institute
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- YABASHI Makina
- RIKEN/SPring-8 Center
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- KAWAGUCHI Tomoya
- Department of Materials Science and Engineering, Kyoto University
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- SHIMADA Koki
- Department of Materials Science and Engineering, Kyoto University
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- TOKUDA Kazuya
- Department of Materials Science and Engineering, Kyoto University
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- TAKAHASHI Isao
- Department of Physics, School of Science and Technology, Kwansei Gakuin University
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- ICHITSUBO Tetsu
- Department of Materials Science and Engineering, Kyoto University
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- MATSUBARA Eiichiro
- Department of Materials Science and Engineering, Kyoto University
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- NISHINO Yoshinori
- RIKEN/SPring-8 Center Research Institute for Electronic Science, Hokkaido University
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Abstract
Ultrafast time-resolved Bragg coherent X-ray diffraction (CXD) has been performed to investigate lattice dynamics in a thin crystal layer with a nanoscale thickness by using a SASE (Self-Amplified Spontaneous Emission)–XFEL (X-ray Free Electron Laser) facility, SACLA. Single-shot Bragg coherent diffraction patterns of a 100 nm-thick silicon crystal were measured in the asymmetric configuration with a grazing exit using an area detector. The measured coherent diffraction patterns showed fringes extending in the surface normal direction. By using an optical femtosecond laser-pump and the XFEL-probe, a transient broadening of coherent diffraction pattern profile was observed at a delay time of around a few tens of picosecond, indicating transient crystal lattice fluctuation induced by the optical laser. A perspective application of the time-resolved Bragg CXD method to investigate small sized grains composing ceramic materials is discussed.
Journal
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- Journal of the Ceramic Society of Japan
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Journal of the Ceramic Society of Japan 121 (1411), 283-286, 2013
The Ceramic Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390282680263614208
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- NII Article ID
- 130004950827
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- NII Book ID
- AA12229489
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- ISSN
- 13486535
- 18820743
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- HANDLE
- 2115/52780
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- NDL BIB ID
- 024291071
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- Text Lang
- en
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- Data Source
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- JaLC
- IRDB
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed