書誌事項
- タイトル別名
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- X-ray stress measurement approximating diffraction profile with Gaussian curves by using method of nonlinear least squares.
- ヒセンケイ サイショウ 2ジョウホウ オ テキヨウシテ カイセン キョウド キ
この論文をさがす
抄録
It is difficult to approximate a diffraction profile to Gaussian curves precisely by using a method of linear least squares. Therefore, a method to approximate it to multiple Gaussian curves by using a method of nonlinear least squares was developed. The present analytical method can be applied widely because it has the following advanteges.<br>1) A whole diffraction profile can be approximated with high accuracy.<br>2) The peek position, half value breadth of a diffraction profile, maximum intensity and background intensity can be obtained simultaneously.<br>3) The measurement system can store the profiles in the form of coefficients of diffraction profiles easily and reproduce them when needed.<br>4) Multiple diffraction curves can be separated easily.<br>5) The method makes it possible to separate an unnecessary diffraction profile from the necessary ones and then eliminate it.<br>6) When this method is utilized, an appropriate initial value of each parameter is necessary. The value decided by a method of linear least squares can be used as the initial value.
収録刊行物
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- 材料
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材料 39 (441), 620-625, 1990
公益社団法人 日本材料学会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390282680368306176
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- NII論文ID
- 110002297633
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- NII書誌ID
- AN00096175
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- ISSN
- 18807488
- 05145163
- http://id.crossref.org/issn/05145163
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- NDL書誌ID
- 3661085
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可