書誌事項
- タイトル別名
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- A Constant Incidence Angle Method to Estimate the Subsurface Distribution of Residual Stress by High-Energy X-Rays from Synchrotron Radiation Source.
- ホウシャコウ コウエネルギー Xセン オ モチイタ ニュウシャカク イッテイホウ ニ ヨル ヒョウメン カ シンブ ノ ザンリュウ オウリョク ブンプ ノ ヒハカイ ヒョウカ
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抄録
A new method is proposed to estimate nondestructively the distribution of the equibiaxial residual stress beneath the surface by using an Eulerian cradle type goniometer. By maintaining a constant value of the X-ray incident angle, the probing depth of X-rays is kept nearly constant, even though sin2ψ is changed. From the slope of the linear relation between the diffraction angle and sin2ψ, the stress value is calculated for a given probing depth. This new method is applied to estimate the residual stress of a shot-peened steel sample, whose compressive zone extended about 150μm below the surface. High energy X-rays of 72keV from synchrotron radiation source, SPring-8, was used for stress measurements. The residual stress distribution estimated by the new method agreed well with that determined by the conventional sin2ψ method with Cr-Kα radiation combined with the method of the successive removal of the surface layer by electropolishing.
収録刊行物
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- 材料
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材料 51 (12), 1429-1435, 2002
公益社団法人 日本材料学会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390282680370110848
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- NII論文ID
- 110002301837
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- NII書誌ID
- AN00096175
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- COI
- 1:CAS:528:DC%2BD3sXks1SqsQ%3D%3D
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- ISSN
- 18807488
- 05145163
- http://id.crossref.org/issn/05145163
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- NDL書誌ID
- 6406108
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可