書誌事項
- タイトル別名
-
- X-Ray Stress Measuring Technique for a Side-Wall of Deep Groove
- フカミゾ ソクヘキブ ノ Xセン オウリョク ソクテイホウ
この論文をさがす
抄録
A new X-ray stress measuring technique – dual-axis inclining method – has been developed to measure stress on a flat surface at confined area like a side-wall of V-groove non-destructively. This technique allows one to measure two mutually orthogonal stress components of the side-wall – the normal stress in the groove-height direction σT and that in the groove-line direction σL – without eliminating a facing side-wall. This technique is characterized by the combination of the iso-inclination scanning (ψ angle) and the side-inclination scanning (Ω angle). The iso-inclination scanning in the plane including the groove-line leaving the side-wall inclined from the reference axis of goniometer's rotation, i.e. the ψ rotation under Ω ≠ 0deg, gives an apparent stress in the groove-line direction. Measuring the relation between the apparent stress and sin2Ω for available range on Ω in which the X-ray path is not prevented by the facing side-wall, one can obtain σL from the y-intercept by extrapolating the regression line of the relation to sin2Ω = 0 and σT from the gradient of the regression line. The validity of this technique was verified by applying this technique and the conventional method to a flat specimen respectively, and comparing the values measured.
収録刊行物
-
- 材料
-
材料 56 (7), 641-646, 2007
公益社団法人 日本材料学会
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1390282680394468992
-
- NII論文ID
- 130002085861
-
- NII書誌ID
- AN00096175
-
- ISSN
- 18807488
- 05145163
-
- NDL書誌ID
- 8893650
-
- 本文言語コード
- ja
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可