Microstructural and Round-Robin Non-Destructive Evaluations for Creep Damage in Cr-Mo-V Steel
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- OHTANI Toshihiro
- Dept. Mech. Eng., Shonan Inst. Tech.
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- YIN Fuxing
- National Inst. for Materials Sci.
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- KOBAYASHI Satoru
- Iwate Univ., Non-destructive Evaluation and Sci., Res. Center
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- KAMADA Yasuhiro
- Iwate Univ., Non-destructive Evaluation and Sci., Res. Center
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- KUROSAKI Ken
- Grad. Sch. of Eng., Osaka Univ.
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- YAMANAKA Shinsuke
- Grad. Sch. of Eng., Osaka Univ.
Bibliographic Information
- Other Title
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- ラウンドロビン試験によるクリープ損傷をうけたCr-Mo-V鋼の非破壊評価とミクロ損傷解析
- ラウンドロビン シケン ニ ヨル クリープ ソンショウ オ ウケタ Cr Mo V コウ ノ ヒハカイ ヒョウカ ト ミクロ ソンショウ カイセキ
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Abstract
We studied the evolution of microstructure in a Cr-Mo-V (JIS-SNB16) during creep by three kinds of nondestructive evaluations (NDEs). After a series of creep samples with various strains was obtained under a tensile stress of 25 and 35MPa at 923K, small samples were removed from the creep samples. Round-robin NDEs were carried out with the small samples. Internal friction with electromagnetic acoustic resonance (EMAR), parameters in magnetic minor hysteresis loops and thermoelectric power (TEP) were measured. Furthermore, the evolution of microstructure was observed with electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM). The results by these NDE techniques have good correlations with microstructural observations. The combination of these techniques would utilize the advantages of the different methods and compensate for the weaknesses. This study suggests the importance of the combined usage in establishing reliable NDE procedures for the determination of creep damage.
Journal
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- Journal of the Society of Materials Science, Japan
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Journal of the Society of Materials Science, Japan 60 (2), 131-138, 2011
The Society of Materials Science, Japan
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Details 詳細情報について
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- CRID
- 1390282680396133376
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- NII Article ID
- 130000435077
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- NII Book ID
- AN00096175
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- ISSN
- 18807488
- 05145163
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- NDL BIB ID
- 11012183
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed