CdZnTe半導体検出器を用いて測定した診断領域X線スペクトルの補正(2)

書誌事項

タイトル別名
  • Correction for X-ray Spectra Measured with a CdZnTe Detector (2)

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説明

X-ray spectra measured with a CdZnTe detector were corrected using response functions calculated with the Monte Carlo method. In the calculation, the Hecht equation was employed to deal with the effects of carrier trapping in a CdZnTe crystal. Corrected spectra showed excellent agreement with x-ray spectra obtained with a HPGe detector. This meant that the response functions calculated in this study were valid. We conclude that a CdZnTe detector can be employed in diagnostic x-ray spectroscopy with proper corrections.

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被引用文献 (2)*注記

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参考文献 (13)*注記

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詳細情報 詳細情報について

  • CRID
    1390282680431414272
  • NII論文ID
    10010439935
  • NII書誌ID
    AN10156808
  • DOI
    10.11318/mii1984.19.58
  • ISSN
    09101543
  • 本文言語コード
    ja
  • データソース種別
    • JaLC
    • CiNii Articles
  • 抄録ライセンスフラグ
    使用不可

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