Statistical properties of x-ray diffraction intensity data

DOI

Bibliographic Information

Other Title
  • Ｘ線回折強度データの統計的な性質

Abstract

The requirement for the precision and accuracy in the XRD measurements have become quite enhanced to obtain more information about the microscopic structures. Weighted least squares methods assuming counting statistics are generally applied to analysis of the intensity data. The method is close to the most likelihood method when the intensity data measured by a counting method are modeled by the Poisson distribution. However, the correction of counting loss is necessary for detailed data analysis. It is not obvious that the corrected data can still be modeled by the Poisson statistics. In this study, the author analitically reveal the statistics about the counting loss of a detection system, and the validity will be discussed by applying Monte Carlo simulation.

Journal

Keywords

Details 詳細情報について

  • CRID
    1390282680593869312
  • NII Article ID
    130006975044
  • DOI
    10.14853/pcersj.2007f.0.428.0
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

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