Analysis of molecular mechanism of mutations induced by heavy ion beams

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Other Title
  • 重イオンビームによる突然変異生成メカニズムの解析

Abstract

Budding yeast S. cerevisiae was used as a model eukaryotic organism to elucidate the molecular mechanism of the mutagenesis caused by ion beams. The budding yeast strains used in this study are S288c (RAD+) and G160/2b (rad52). The yeast strains were irradiated with carbon ions (12C5+; 220 MeV) with the dose 10 to 300 Gy, and LET is 107 keV/µm. Carbon ion beam was generated from AVF cyclotron in JAEA. The mutation sites of ura3 mutants were determined by DNA sequencing. The mutational specificity of carbon ion beams was studied in the URA3 gene. Mutations generated by ion beams are dominantly transversion, whereas, mutations of spontaneous generation are usually transition. Our experiments showed that the type of base changes induced by carbon ions include transversion (68.7%), transition (13.7%), and (17.6%). Moreover, the fact that GC→TA transversion were largely observed suggests that the mutations by ion beams resulted from oxidative damage such as formation of 8–oxodGTP mainly. In comparison with the surrounding sequence context of mutational base sites, the C residues in the 5’–AC(A⁄T)–3’ sequence were found to be easily changed.

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Details 詳細情報について

  • CRID
    1390282680616251648
  • NII Article ID
    130006999428
  • DOI
    10.11513/jrrsabst.2006.0.240.0
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

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