1-8b 偏光解析法を用いた液晶配向の動的電場応答の評価
書誌事項
- タイトル別名
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- Evaluation of eletrical dynamic responce of Liquid Crystal orientation by ellipsometry
説明
The dye-doped reflection ellipsometry is effective method to investigate the behavior of Liquid Crystal director at the interface between LC and alignment film. For the quantitative estimate of the polar anchoring strength of LC cells, it is important to analyze the optical parameters(thickness, refractive index) of the alignment film, ITO film and glass substrate. We mesured these optical parameters and electrical dynamic responce of LC cells. Dye doped ellipsometry allows to estimate the polar anchoring strength quantitatively by comparing exprimental results with thoretical ones.
収録刊行物
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- 日本液晶学会討論会講演予稿集
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日本液晶学会討論会講演予稿集 1998 (0), 112-113, 1998
一般社団法人 日本液晶学会
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詳細情報 詳細情報について
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- CRID
- 1390282680664694272
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- NII論文ID
- 110001464068
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- ISSN
- 24325988
- 18803490
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
