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- 市川 紀充
- 工学院大学
書誌事項
- タイトル別名
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- Electrostatically Induced Voltage Generated in Conductors Contained in an Ungrounded Metal Box
- ヒセッチ キンゾクキョウタイナイ ノ ドウタイ ニ ショウジル セイデンユウドウ デンアツ
この論文をさがす
抄録
Low relative humidity and the use of microelectronic devices cause electronic apparatuses to malfunction. The malfunction is caused by an electrostatically induced voltage generated in a partly opened metal box within the apparatus. For example， when a charged body moves in front of a metal box，an induced voltage is generated in the conductors contained in the metal box. Under normal conditions，ungrounded metal boxes are used. The induced voltage generated in an ungrounded metal box is never cleared when a charged body moves near the metal box. In this study，the induced voltage generated in the ungrounded metal box is cleared. The result shows that an induced voltage of 3 kV is generated in the ungrounded metal box when a charged body of 10 kV moves near the metal box. The results will be useful for designing an apparatus which will not malfunction.
収録刊行物
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- 電気設備学会誌
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電気設備学会誌 30 (7), 598-606, 2010
一般社団法人 電気設備学会
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詳細情報 詳細情報について
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- CRID
- 1390282680720593280
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- NII論文ID
- 10027980861
- 130004682652
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- NII書誌ID
- AN10067173
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- ISSN
- 21886946
- 09100350
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- NDL書誌ID
- 10775570
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可