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- TAKEUCHI Masaki
- Fuji Electric Advanced Technology Co., Ltd.
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- KUBOYAMA Kimimasa
- Fuji Electric Advanced Technology Co., Ltd.
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- NAKAHARA Hiroaki
- Fuji Electric Advanced Technology Co., Ltd.
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- MATSUMOTO Satoshi
- Fuji Electric Advanced Technology Co., Ltd.
Bibliographic Information
- Other Title
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- 20916 低真空領域における粒子挙動解析方法の検討(化学反応・複雑流体,一般講演)
Description
The particle of the film deposition sub-product etc. is one of the factors which leads to the quality decrease in the film deposition device under a low vacuum. The particle behavior analysis is important for the factor analysis. However, the analysis in a low vacuum was difficult although the particle behavior analysis under the atmospheric pressure was possible. In this study, the fluid resistance that is applied on the particle in a low vacuum was revised by the function of pressure, and implication method to general fluid analysis software was examined. The capability to reproduce the falling movement of a particle due to gravity was confirmed by an experiment.
Journal
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- The Proceedings of Conference of Kanto Branch
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The Proceedings of Conference of Kanto Branch 2009.15 (0), 409-410, 2009
The Japan Society of Mechanical Engineers
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Details 詳細情報について
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- CRID
- 1390282680823857536
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- NII Article ID
- 110007722404
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- ISSN
- 24242691
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- Text Lang
- ja
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed