Precise Measurement of High-Temperature Liquid Density and Structure(<Special Topic>Recent Development in Thermophysical Property Measurements of High-Temperature Melts for Crystal Growth)

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  • 高温融体の高精度密度計測と融体構造(<特集>結晶成長を支える高温熱物性計測技術の進展)
  • 高温融体の高精度密度計測と融体構造
  • コウオンユウタイ ノ コウセイド ミツド ケイソク ト ユウタイ コウゾウ

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Abstract

A method of accurately measuring the densities of high-temperature liquids levitated by electromagnetic levitation (EML) technique within the static magnetic fields is proposed. The method is based on the electromagnetic effect on the moving electrical conductivity materials. The liquid metal sample levitated by EML technique is oscillating by the electromagnetic force, and also is moving in the coils. For the liquid samples, if we apply a static magnetic field, the Lorentz force by the interaction between the electrical conductive sample and the static magnetic fields reduces the surface oscillation and translational motion of samples. For the effect, we can precisely obtain the correct volume of levitated liquid samples like a solid body. For applying the technique, we can measure the density of high-temperature liquid silicon in the range 1100 to 2000K. Using the technique we succeeded to reduce an order of magnitude compared with previously reported data. From the precise measurement of liquid silicon density, we found that the density has the maximum value in undercooled regions expected from the first principle molecular dynamics (FPMD) simulations. We also performed the structural analysis of liquid silicon by x-ray diffraction combined with the EML technique. Based on these results, we discuss about the temperature dependence of liquid silicon density from the view point of the structure of liquid silicon based on the tetrahedral coordination in the short range order. From these discussions, we show the importance of density measurement of high-temperature liquids for crystal growth simulations and understanding of the liquid structure and properties.

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