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- MUTO Hiroshi
- Nano-Metrology and Control Lab, Department of Nanomechanics, Tohoku University
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- SAITO Yusuke
- Nano-Metrology and Control Lab, Department of Nanomechanics, Tohoku University
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- ARAI Yoshikazu
- Nano-Metrology and Control Lab, Department of Nanomechanics, Tohoku University
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- GAO Wei
- Nano-Metrology and Control Lab, Department of Nanomechanics, Tohoku University
Bibliographic Information
- Other Title
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- 188 平面ステージ姿勢計測用光学式角度センサに関する研究(生産加工・工作機械II,一般講演)
Journal
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- The Proceedings of Conference of Tohoku Branch
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The Proceedings of Conference of Tohoku Branch 2010.45 (0), 176-177, 2010
The Japan Society of Mechanical Engineers
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Details 詳細情報について
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- CRID
- 1390282680922046464
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- NII Article ID
- 110008744375
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- ISSN
- 24242713
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- Text Lang
- ja
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- Data Source
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- JaLC
- Crossref
- CiNii Articles