19pCF-2 Photoinduced Phase Changes in Ge_2Sb_2Te_5 by Time-Resolved X-ray and Electron Diffraction

Bibliographic Information

Other Title
  • 19pCF-2 時間分解X線・電子線回折による相変化記憶材料Ge_2Sb_2Te_5の光誘起構造相転移過程

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Details 詳細情報について

  • CRID
    1390282680934201216
  • NII Article ID
    110010031255
  • DOI
    10.11316/jpsgaiyo.70.2.0_1364
  • ISSN
    21890803
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles

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