30pVE-2 The assessment of QA Method using diode array measurement to MLC position error
Bibliographic Information
- Other Title
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- 30pVE-2 ダイオードアレイを用いたMLCのアライメント確認方法の検討(30pVE X線・粒子線(粒子線の医学利用),領域10(誘電体,格子欠陥,X線・粒子線,フォノン物性))
Journal
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- Meeting Abstracts of the Physical Society of Japan
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Meeting Abstracts of the Physical Society of Japan 64.1.4 (0), 985-, 2009
The Physical Society of Japan
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Details 詳細情報について
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- CRID
- 1390282680946298752
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- NII Article ID
- 110007373384
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- ISSN
- 21890803
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles