24pZB-7 Spectral response measurement of SiC semiconductor detector
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- Yokoyama T.
- Okayama.Univ
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- Nakano I.
- Okayama.Univ
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- Tanaka R.
- Okayama.Univ
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- Iwami M.
- Okayama.Univ
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- Ohshima T.
- JAERI
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- Itoh H.
- JAERI
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- Kinoshita A.
- AIST
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- Fukushima Y.
- KEK
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- Unno Y.
- KEK
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- Terada S.
- KEK
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- Ikegami Y.
- KEK
Bibliographic Information
- Other Title
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- 24pZB-7 SiC半導体検出器の分光感度測定(半導体検出器,素粒子論)
Journal
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- Meeting Abstracts of the Physical Society of Japan
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Meeting Abstracts of the Physical Society of Japan 60.1.1 (0), 23-, 2005
The Physical Society of Japan
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Details 詳細情報について
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- CRID
- 1390282680978066176
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- NII Article ID
- 110004534300
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- ISSN
- 21890803
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles