Cause of Locked-mode existence in TPE-RXE
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- Koguchi H.
- Electrotechnical Laboratory
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- Yagi Y.
- Electrotechnical Laboratory
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- Hirano Y.
- Electrotechnical Laboratory
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- Shimada T.
- Electrotechnical Laboratory
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- Sekine S.
- Electrotechnical Laboratory
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- Sakakita H.
- Electrotechnical Laboratory
Bibliographic Information
- Other Title
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- 23aXG-2 TPE-RXに於けるLocked-modeの発生機構について
Journal
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- Meeting Abstracts of the Physical Society of Japan
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Meeting Abstracts of the Physical Society of Japan 55.2.2 (0), 167-, 2000
The Physical Society of Japan
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Details 詳細情報について
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- CRID
- 1390282681010540032
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- NII Article ID
- 110002188943
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- ISSN
- 21890803
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles
